[reference paper] Kyunghoon Lee, Sangyeong Jeong, Wooshin Choi, Jung-Hwan Choi, and Jingook Kim, “Characterization and Application of Improved Oscilloscope IC for System Diagnosis of ESD and HPEM Effects”, IEEE Transactions on Electromagnetic Compatibility.

– Oscilloscope IC (ver. 2) for on-system diagnosis

– Fabricated with TSMC MPW (180nm BCD process), 2023.