[reference paper] Kyunghoon Lee, Sangyeong Jeong, Wooshin Choi, Jung-Hwan Choi, and Jingook Kim, “Characterization and Application of Improved Oscilloscope IC for System Diagnosis of ESD and HPEM Effects”, IEEE Transactions on Electromagnetic Compatibility, vol. 66, no. 6, pp. 1804-1818, Dec. 2024.

– Oscilloscope IC (ver. 2) for on-system diagnosis

– Fabricated with TSMC MPW (180nm BCD process), 2023.