[reference paper] Myungjoon Park, Junsik Park, Joungcheul Choi, Jinwoo Kim, Seonghoon Jeong, Manho Seung, Seokkiu Lee and Jingook Kim, “Measurement and Analysis of Statistical IC Operation Errors in a Memory Module due to System-Level ESD Noise”, IEEE Transactions on Electromagnetic Compatibility, vol. 61, no. 1, pp. 29-39, Feb 2019.

– Used for malfunction tests of F/F register due to ESD noises

– Fabricated with M/H MPW (180nm CMOS process), 2015.