[reference paper] Young-Sung Kwon and Jingook Kim, “Statistical Eye and BER Analysis for PAM3 Simultaneous Switching Outputs with Non-identical On-chip VDD and VSS Fluctuations“, accepted to IEEE Transactions on Circuits and Systems I: Regular Papers, 2025.

– PAM3 SSO driver IC for Statistical Analysis on Signal and Power integrity

– Fabricated with TSMC MPW (180nm BCD process), 2023.