[reference paper] Eunkyeong Park, Hyungsoo Kim, Jongjoo Shim, Yongju Kim, Yunsaing Kim, and Jingook Kim, “Analytical Calculation of Jitter Probability Density at Multi-Stage Output Buffers due to Supply Voltage Fluctuations”, IEEE Transactions on Electromagnetic Compatibility, vol. 57, no. 4, pp. 796-806, Aug. 2015.

– Used for analysis and measurement of power supply-induced jitter due to switching buffer

– Fabricated with Dongbu MPW (110nm CMOS process), 2014.